X-ray fluorescence imaging spectrometer
Fan from the musée de la Princerie in Verdun (France) under the measurement head of the X-ray fluorescence imaging spectroscope
© DIM Matériaux anciens et patrimoniaux
X-ray fluorescence (XRF) is an analytical technique allowing the identification of chemical elements present in materials composing the analyzed objects. XRF imaging performs the scanning of the choosen area in order to visualize the distribution of the chemical elements.
Presentation
Analyses performed at the CRC on the XRF imaging spectrometer are dedicated to materials composing cultural heritage objects (graphic documents, herbarium, fossils, musical instruments, etc.).
The XRF imaging spectrometer at the CRC is the Bruker M6 Jetstream.
The excitation is supplied by a rhodium target with a 100 µm thick beryllium window, a maximum tension of 50 kV and a maximum intensity of 600 µA.
The beam is transmitted by polycapillary optics, allowing beam sizes from 100 to 450 µm.
A filter wheel with 5 filters adapts the detection to specific chemical elements, whose fluorescence radiation are detected by a silicon drift detector (SDD) with a Peltier cooler.
The scanning range goes to 80 x 60 cm² and the choosen area must be relatively flat.
Objects might be scanned either horizontally or vertically.
Credits
CRC - Cité de la Musique - Philarmonie de Paris
Contacts
Oulfa Belhadj – oulfa.belhadj@mnhn.fr – +33.1.40.79.53.08
Marie Radepont – marie.radepont@mnhn.fr – +33.1.40.79.53.09
Published on: 20/07/2023 16:55 - Updated on: 14/09/2023 11:06